Search results for "device lifetime"
showing 2 items of 2 documents
Degradation mechanisms in organic lead halide perovskite light-emitting diodes
2019
Organic–inorganic metal halide perovskites have attracted significant attention for low-cost, high-efficiency, color-pure light-emitting applications. However, as seen in many reports so-far, perovskite light-emitting diodes (PeLED) suffer from poor operational lifetime, limiting their practical use. The underlying degradation mechanism is a topic of crucial importance. Here, the degradation mechanisms of methylammonium lead bromide based PeLED are investigated. When the PeLED is electrically biased, there is an initial raise in the luminance followed by a rapid reduction in luminance and current density. Microscopic studies reveal the formation of micrometer-sized spots that are photolumin…
An energy analysis of IEEE 802.15.6 scheduled access modes
2010
Body Area Networks (BANs) are an emerging area of wireless personal communications. The IEEE 802.15.6 working group aims to develop a communications standard optimised for low power devices operating on, in or around the human body. IEEE 802.15.6 specifically targets low power medical application areas. The IEEE 802.15.6 draft defines two main channel access modes; contention based and contention free. This paper examines the energy lifetime performance of contention free access and in particular of periodic scheduled allocations. This paper presents an overview of the IEEE 802.15.6 and an analytical model for estimating the device lifetime. The analysis determines the maximum device lifeti…